The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

When you “snap” a photo with a point-and-shoot camera or a cell phone, you hope to obtain a blemish-free image. The makers of CMOS image sensors used in these and other electronic products have a ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...