QA teams now use machine learning to analyze past test data and code changes to predict which tests will fail before they run. The technology examines patterns from previous test runs, code commits, ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Tokyo, Japan – Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Machine learning is a rapidly growing field with endless potential applications. In the next few years, we will see machine learning transform many industries, including manufacturing, retail and ...

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...